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    Helios Confocal (Femtosecond Transient Absorption Microscope)

    The HELIOS Confocal Microscope is developed for transient absorption microscopy of a wide variety of objects. The microscope can be set up independently or as an add-on to an existing HELIOS ultrafast transient absorption spectrometer. The unique design enables measurements with sub-2 um spatial resolution. Users can switch between the reflection and transmission modes when studying thin films, semiconductor wafers, nanostructures, etc. This microscope enables studying micron-size samples or specific areas on heterogeneous samples. The built-in 2D camera makes it easy to find a spot of interest.

    Overview

    The HELIOS Confocal Microscope is developed for transient absorption microscopy of a wide variety of objects. The microscope can be set up independently or as an add-on to an existing HELIOS ultrafast transient absorption spectrometer. The unique design enables measurements with sub-2 um spatial resolution. Users can switch between the reflection and transmission modes when studying thin films, semiconductor wafers, nanostructures, etc. This microscope enables studying micron-size samples or specific areas on heterogeneous samples. The built-in 2D camera makes it easy to find a spot of interest.

    Specification

    Spot size < 2 µm
    Imaging resolution 1.5 µm (for 750 nm)
    Spectral range 450 – 750 nm
    Time resolution ~ 300 fs (with a 70 fs laser pulse)
    Camera viewing window 68 x 90 µm
    Objective working distance 11 mm
    Numerical aperture 0.6
    Magnification 50 X

    Key Features

    • Spectrally and spatially resolved measurements.
    • Support for large samples.
    • Direct viewing of the sample.
    • Tracking of the measured spot.
    • Precise sample position control.
    • Simplified switching between transmission and reflection modes.
    • Customizable optical setup.
    • User-friendly Software.

    Applications

    • Spatially resolved ultrafast dynamics.
    • Kinetics mapping on heterogeneous samples.
    • Nanostructures.
    • Thin films.

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