Overview
MPI TS2000-SE is a 200 mm Automated Probe System for accurate and reliable DC/CV, RF and mmW measurements
MPI TS2000-SE is a 200 mm Automated Probe System for accurate and reliable DC/CV, RF and mmW measurements.
MPI TS2000-SE is a 200 mm Automated Probe System for accurate and reliable DC/CV, RF and mmW measurements
Designed for Variety of On-Wafer Applications
MPI ShielDEnvironment™ for Accurate Measurements
Ergonomic Design and Options
Chuck XY Stage (Programmable) | |
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Travel range | 210 x 300 mm (8.27 x 11.81 in) |
Resolution | 0.5 µm |
Accuracy | < 2.0 µm |
Repeatability | < 2.0 µm |
XY stage drive | High resolution stepper motor with linear encoder feedback system |
Speed* | 4-Speed XY chuck stage adjustable speed movement |
Max. movement speed | 100 mm/sec |
Chuck Z Stages | |
Travel range | 50 mm (2 in) |
Resolution | 0.2 µm |
Accuracy | < 2.0 µm |
Repeatability | < 1.0 µm |
Z stage drive | High resolution stepper motor with integrated pin drive system for easy wafer loading |
Speed* | 3-Speed Z chuck stage adjustable speed movement |
Chuck Theta Stage (Programmable) | |
Travel range | ± 6.0° |
Resolution | 0.0004° |
Accuracy | < 2.0 µm (measured at the edge of the 200 mm chuck) |
Repeatability | < 1.0 µm |
Theta stage drive | High resolution stepper motor with linear encoder feedback system |
Video Camera (Vertical Control Environment | |
Sensor type | 1/1.8″ mono CCD |
Sensor size | 7.07 mm x 5.3 mm |
Camera pixels | 3 MP |
Resolution | 2048 x 1536 pixels |