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CMOS Image Sensor Tester
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CMOS Image Sensor Tester

CMOS Image Sensor Tester: The SG-A system is the world’s first commercial CMOS Image sensor tester. SG-A can provide the most comprehensive CMOS image sensor parameter characterizations, such as full-spectrum quantum efficiency QE, overall system gain K, temporal dark noise, signal-to-noise ratio, absolute sensitivity threshold, saturation capacity, dynamic range, DSNU, PRNU, Linearity error, and chief-ray angle CRA.

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Overview

CMOS Image Sensor Tester: The SG-A system is the world’s first commercial CMOS Image sensor tester. SG-A can provide the most comprehensive CMOS image sensor parameter characterizations, such as full-spectrum quantum efficiency QE, overall system gain K, temporal dark noise, signal-to-noise ratio, absolute sensitivity threshold, saturation capacity, dynamic range, DSNU, PRNU, Linearity error, and chief-ray angle CRA.

Key Features

  • non-destructive optical inspection.
  • High collimated beam angle; <0.05°, <0.1°, <0.5°, <1°, <3°(different models).
  • High Uniform Beam spot: ≥ 99%.
  • Light instability ≤ 1%.
  • High dynamic range testing capability: 80dB~140dB (different models).
  • Application: fingerprint recognition (CIS+Lens, CIS+collimator, TFT-array sensor) micro-lens design of CIS, wafer level optics inspection, CIS DSP chip algorithm development, Si TFT sensor panel, Time-of-Flight camera sensor, Proximity Sensor (Quantum efficiency, sensitivity, linearity, SNR et al.,),d-ToF sensor, i-ToF sensor, Multi-spectral sensor, Ambient light sensor (ALS), Fingerprint-Under-Display (FoD) sensor.

Specification

  • Full-spectrum wavelength range: 300-1100nm or 350-1000nm (PTC).
  • Wavelength range can be extended to 1700nm or more.
  • Single wavelength source: 470nm, 530nm, 630nm, 940nm (±5nm), or customized.
  • Dynamic Range: 80dB, 100dB, or 140dB.
  • Test fixtures: DUT≤ 100mm x 100mm x 30mm(Hight)[Basic type] or customized.
  • Stage: Non, manual 3-axis, or 6-axis (manual + automatic) stages (can be customized).

Applications

  • Fingerprint recognition (CIS+Lens, CIS+collimator, TFT-array sensor).
  • Micro-lens design of CIS, wafer level optics inspection.
  • CIS DSP chip algorithm development.
  • Si TFT sensor panel.
  • Time-of-Flight camera sensor.
  • Proximity Sensor (Quantum efficiency, sensitivity, linearity, SNR et al.,).

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