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    APD QE

    APD-QE (Advanced Photo detector – Quantum Efficiency System )adopts spatial light homogenizing technology and follows the ASTM standard “Irradiance Mode” test method, which has proven that it can accurately perform quantum efficiency and other key parameter measurements of advanced photo detectors.

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    Overview

    APD-QE (Advanced Photo detector – Quantum Efficiency System )adopts spatial light homogenizing technology and follows the ASTM standard “Irradiance Mode” test method, which has proven that it can accurately perform quantum efficiency and other key parameter measurements of advanced photo detectors.

    Key Features

    • Uniform light beam spot (“Irradiance Mode”) which complies with ASTM E1021.
    • A uniform light spot can overcome the problems of chromatic dispersion and aberration, accurately measuring the EQE curve of micrometer-level photodetectors compared to traditional focused beam spots.
    • It can be paired with a variety of probe station systems for non-destructive and rapid testing.
    • The integrated optics and test system improve system construction efficiency.
    • One-key automatic test software provides automatic full spectrum calibration and measurement, enhancing work efficiency.

    Test Characteristics

    • External quantum efficiency EQE.
    • Spectral response SR.
    • I-V curve measurement.
    • NEP spectrum measurement.
    • D*spectrum measurement.
    • Noise-current-frequency response graph (A/Hz-1/2; 0.01Hz~1,000Hz).
    • Flicker noise, Johnson Noise, Shot noise analysis.

    Applications

    • Optical sensor in LiDAR– InGaAs Photodiode/ SPAD.
    • Photosensor of APPLE Watch.
    • Photodiode-gated Transistor for high gain sensing and imaging.
    • High Photoconductivity Gain and Fill-Factor Optical Sensor.
    • Highly-sensitive indirect-conversion X-ray Detector characterization.
    • Silicon Photonics.

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