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QE-Rx IPCE Measurement & Loss Analyzer

QE-RX is a PV cell efficiency-loss analyzer for high-efficiency solar cell research and development.
Since 2015, the loss mechanism has been key information for improving the conversion efficiency of PERC, HJT, TOP-Con, and other highly efficient solar cells.
Conversion efficiency loss can be attributed to three factors:
short-circuit current density (Jsc),
open-circuit voltage (Voc), and
fill-factor (FF) losses.
QE-RX can not only measure PV-EQE, Reflectance, and PV-IQE data but also analyze Jsc, Voc, and FF losses by combining the analysis software SQ-JVFLA.
Enlitech integrates three different testing functions within QE-RX and develops SQ-JVFLA software to help users analyze three different losses using the Shockley-Queisser thermal limit theory. ]
QE-RX is your best partner for boosting PV efficiency.

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Overview

  • QE-RX is a PV cell efficiency-loss analyzer for high-efficiency solar cell research and development.
  • Since 2015, the loss mechanism has been key information for improving the conversion efficiency of PERC, HJT, TOP-Con, and other highly efficient solar cells.
  • Conversion efficiency loss can be attributed to three factors:
  • short-circuit current density (Jsc),
  • open-circuit voltage (Voc), and
  • fill-factor (FF) losses.
  • QE-RX can not only measure PV-EQE, Reflectance, and PV-IQE data but also analyze Jsc, Voc, and FF losses by combining the analysis software SQ-JVFLA.
  • Enlitech integrates three different testing functions within QE-RX and develops SQ-JVFLA software to help users analyze three different losses using the Shockley-Queisser thermal limit theory. ]
  • QE-RX is your best partner for boosting PV efficiency.

Specification

Feature Description
Applicable Solar Cell Types PESC, PERC, PERL, HJT, back-contact, bi-facial, and TOP-Con Si solar cells
Quantum Efficiency (QE) Data provided
PV-EQE (External Quantum Efficiency) Data provided
IPCE (Incident Photon-to-Electron Conversion Efficiency) Data provided
Spectral Response (SR) Data provided
Internal Quantum Efficiency (IQE) Data provided
Reflectance Data provided
Compactness and Repeatability Compact size with high repeatability over 99.5%
Wavelength Range 300 nm to 1200 nm
Jsc Loss Analysis Report provided with SQ-JVFLA software
Voc Loss Analysis Report provided with SQ-JVFLA software
FF Loss Analysis Report provided with SQ-JVFLA software
Sample Test Fixtures Variety of customizable sample test fixtures available

Applications

 

  • PERC/ HJT/ TOP-Con PV Solar Cell Efficiency-Loss Analysis
  • IEC-60904-8 Spectral Response measurement
  • IEC-60904-7 Mismatch Factor calculation
  • IEC-60904-1 MMF Correction
  • Si solar cell processing quality control
  • Si solar cell bandgap determination

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